| Webster's Online Dictionary |
| Expressions | Domain | Definition | |
| I-c dynamic test system | Electrical Engineering | Test system for integrated circuits in which circuits fed into a conveyor are sequentially tested and an individual record made for each on a punched card or magnetic tape; e. g. , Texas Instruments Model 553 system. Source: European Union. (references) | |
Source: compiled by the editor from various references; see credits. | Top | ||
