Dictionary - Definition of ELECTROMIGRATION

Domain	Definition
Computing	Electromigration Mass transport due to momentum exchange between conducting electrons and diffusing metal atoms. Electromigration causes progressive damage to the metal conductors in an integrated circuit. It is characteristic of metals at very high current density and temperatures of 100C or more. The term was coined by Professor Hilbert Huntington in the late 1950s because he didn't like the German use of the word "electrotransport". Mass transoport occurs via the Einstein relation J=DFC/kT where F is the driving force for the transoport. For electromigraiton F is zepj and z is an electromigration parameter relating the momentum exchange and z is the charge of the "diffusing" species. (1999-02-25) Source: The Free On-line Dictionary of Computing.
Wikipedic	Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is only important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect increases. (references)
Source: compiled by the editor from various references; see credits.		Top

Topics by Level of Interest: ELECTROMIGRATION
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Electromigration	32	Electromigration	32
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Specialty Definition: ELECTROMIGRATION